The DF-745 provides trace and ultra-trace moisture contaminant measurements for LED/LCD manufacturing processes. Able to monitor multiple background gases, the DF-745 delivers exceptional performance operational flexibility in a compact unit.

With an intelligent and robust hardware/software design, this analyzer can be moved easily from port to port, virtually eliminating dry down times often associated with these applications. 

Offering a Lower Detection Limit (LDL) of 1ppb, the DF-745 uses industry-leading Tunable Diode Laser (TDL) sensing technology. This sensor delivers ultra-reliable baseline measurements and a fast speed of response; with a robust Herriot cell preventing loss in mirror reflectivity, moisture contact with optical components is minimized, ensuring an accurate measurement. Added to its flexibility and accuracy is affordability; zero drift extends calibration intervals while minimal ongoing maintenance provides a low cost of lifetime ownership.

  • Trace level Tunable Diode Laser (TDL) sensing provides high stability measurements 
  • Broad detection range: 0ppb – 20ppm 
  • Operable via front panel or digital communication options 
  • Simplified ongoing maintenance requirements with no consumables required 
  • High reliability; repeatable baseline measurements are not affected by a loss in mirror reflectivity 
  • Compact with a low weight; moves easily from port to port and ideal for other mobile applications 

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Sebastian Kelderman