Designed specifically to make trace and ultra-trace measurements in a range of ultra high purity gases, the DF-750 is the leading choice in moisture analysis for the semiconductor industry. Optimized for use in 300m semiconductor fabs, the DF-750 measures moisture as a contaminant in electronics grade nitrogen, hydrogen, helium, argon and oxygen.

With Servomex’s industry-leading TDL sensing technology delivering an industry-leading 100ppt Lower Detection Limit (LDL), the DF-750 delivers a stable, highly accurate measurement that meets the precise monitoring needs of semiconductor production.

This analyzer also offers attractive affordability over product life. The DF-750’s robust sensor construction has low lifetime maintenance requirements and delivers zero-drift stability that greatly extends calibration intervals. This low cost- of-ownership combined with exceptional measurement performance means that the DF-750 is the first-choice analytical solution for UHP gas quality checks.

  • Trace level Tuneable Diode Laser (TDL) sensing provides high stability and minimal moisture contact with optical elements
  • Broad detection range: 0-20ppm
  • Storage and recall function: calibration, system error and measurement data facilitates archiving operational history
  • Operable via front panel or digital communication options
  • Simplified ongoing maintenance requirements through the use of non-depleting, low drift potential TDL sensing technology
  • High reliability; repeatable baseline measurements are not affected by a loss in mirror reflectivity

Customer Service

Sebastian Kelderman